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Title: Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT Workshop on Designing for Yield, 1-3 July 1987, Oxford: Papers Presented at ... on Designing for Yield, Oxford, 1-3 July 1987.
Description: Crc Press, 1988. Edition: 1. Hardcover with dustjacket, Pages: 304. Fast Dispatch. Expedited UK Delivery Available. Excellent Customer Service. Bookbarn International Inventory #2582091 Used; Good. ISBN: 9780852743980.
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See more books from our catalog: Art, Architecture & Photography
Title: Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT Workshop on Designing for Yield, 1-3 July 1987, Oxford: Papers Presented at ... on Designing for Yield, Oxford, 1-3 July 1987.
Description: Crc Press, 1988. Edition: 1. Hardcover with dustjacket, Pages: 304. Fast Dispatch. Expedited UK Delivery Available. Excellent Customer Service. Bookbarn International Inventory #2582091 Used; Good. ISBN: 9780852743980.
Keywords:
Price: GBP 9.79 = appr. US$ 13.98 Seller: Bookbarn International
- Book number: 2582091
- Book number: 2582091
See more books from our catalog: Art, Architecture & Photography